Few-shot anomaly detection (FSAD) is essential in industrial manufacturing. However, existing FSAD methods struggle to effectively leverage a limited number of normal samples, and they may fail to detect and locate inconspicuous anomalies in the spatial domain. We further discover that these subtle anomalies would be more noticeable in the frequency domain. In this paper, we propose a Dual-Path Frequency Discriminators (DFD) network from a frequency perspective to tackle these issues. Specifically, we generate anomalies at both image-level and feature-level. Differential frequency components are extracted by the multi-frequency information construction module and supplied into the fine-grained feature construction module to provide adapted features. We consider anomaly detection as a discriminative classification problem, wherefore the dual-path feature discrimination module is employed to detect and locate the image-level and feature-level anomalies in the feature space. The discriminators aim to learn a joint representation of anomalous features and normal features in the latent space. Extensive experiments conducted on MVTec AD and VisA benchmarks demonstrate that our DFD surpasses current state-of-the-art methods. Source code will be available.

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